In this chapter we will try to give the information needed for an efficient application of SESAME to different analysis methods and equipment. These different applications are: Scanning Electron Microscopy (SEM) including EDX/WDX (Chapter 4.1), Transmission Electron Microscopy (TEM) (Chapter 4.3) including analytical TEM, Electron Probe Micro-Analysis (EPMA) with an Electron Micro Probe (EMP), and Auger Electron Spectroscopy (AES) (Chapter 4.4).
For each of these different methods a set of appropriate default values has been defined. These default values support the user so that she/he does not need to specify all of the parameters in the input deck. This keeps the generation time of the input deck short and the input deck itself clearly arranged.
In this chapter parameter and geometry input is only described by means of the actual input and geomentry files read by SESAME during program execution. These files might be also generated by means of the graphical user interfaces (GUI) provided within the VISTA TCAD framwork. For more information concerning the GUI see Chapter 5.